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1

Scanning Electron Microscopy and X-Ray Microanalysis || ImageJ and Fiji

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 1.10 MB

english, 2018

2

Scanning Electron Microscopy and X-ray Microanalysis || The SEM and Its Modes of Operation

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.86 MB

english, 2003

3

Scanning Electron Microscopy and X-Ray Microanalysis || Trace Analysis by SEM/EDS

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 2.08 MB

english, 2018

4

Designated non-financial businesses and professions

Newbury, Michael

Journal:

Journal of Money Laundering Control

Year:

2017

Language:

english

File:

PDF, 150 KB

english, 2017

5

The history and evolution of wiredrawing techniques

Brian D. Newbury, Michael R. Notis

Journal:

JOM Journal of the Minerals, Metals and Materials Society

Year:

2004

Language:

english

File:

PDF, 535 KB

english, 2004

6

Scanning Electron Microscopy and X-ray Microanalysis || Quantitative X-Ray Analysis: The Basics

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.51 MB

english, 2003

7

Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Electron Beam X-Ray Microanalysis

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 4.42 MB

english, 2003

8

Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Scanning Electron Microscopy

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 4.23 MB

english, 2003

9

Scanning Electron Microscopy and X-ray Microanalysis || Generation of X-Rays in the SEM Specimen

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 1.99 MB

english, 2003

10

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary

Wyatt, J. Matney, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.

Year:

2011

Language:

english

File:

PDF, 3.38 MB

english, 2011

11

Scanning Electron Microscopy and X-Ray Microanalysis || Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM)

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 2.02 MB

english, 2018

12

Scanning Electron Microscopy and X-ray Microanalysis || Procedures for Elimination of Charging in Nonconducting Specimens

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.39 MB

english, 2003

13

Scanning Electron Microscopy and X-ray Microanalysis || Ambient-Temperature Specimen Preparation of Biological Material

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.60 MB

english, 2003

14

Scanning Electron Microscopy and X-ray Microanalysis || Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.03 MB

english, 2003

15

Scanning Electron Microscopy and X-ray Microanalysis || X-Ray Spectral Measurement: EDS and WDS

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.94 MB

english, 2003

16

Scanning Electron Microscopy and X-ray Microanalysis || Specimen Preparation of Polymer Materials

Goldstein, Joseph I., Newbury, Dale E., Echlin, Patrick, Joy, David C., Lyman, Charles E., Lifshin, Eric, Sawyer, Linda, Michael, Joseph R.

Year:

2003

Language:

english

File:

PDF, 2.84 MB

english, 2003

17

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - SEM-EDX analysis of an unknown "known" white powder found in a shipping container from Peru

Albright, Douglas C., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.

Year:

2009

Language:

english

File:

PDF, 1.53 MB

english, 2009

18

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Forensic document analysis using scanning microscopy

Shaffer, Douglas K., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.

Year:

2009

Language:

english

File:

PDF, 2.09 MB

english, 2009

19

Book reviews

Stradling, R.A., Cunningham, Bernadette, Law, Robin, Duffy, Michael, Derry, John, Sainsbury, John, Lenman, Bruce P., Burroughs, Peter, Martin, Ged, Newbury, Colin, Bayly, C.A., Copley, Antony, Mukherj

Journal:

The Journal of Imperial & Commonwealth History

Year:

1992

Language:

english

File:

PDF, 2.76 MB

english, 1992

20

SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - The Bayesian approach to reporting GSR analysis results: some first-hand experiences

Charles, Sebastien, Nys, Bart, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C.

Year:

2010

Language:

english

File:

PDF, 473 KB

english, 2010

21

Polite Gaiety: Cultural Hierarchy and Musical Comedy, 1893-1904

Newbury, Michael

Journal:

The Journal of the Gilded Age and Progressive Era

Year:

2005

Language:

english

File:

PDF, 5.06 MB

english, 2005

22

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Dispersion free all reflective confocal microscope objective

Walecki, Wojtek J., Scaggs, Mike, Walecki, Peter S., Szondy, Fanny, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.

Year:

2011

Language:

english

File:

PDF, 120 KB

english, 2011

23

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Newbury, Dale E., Ritchie, Nicholas W. M.

Year:

2014

Language:

english

File:

PDF, 4.12 MB

english, 2014

24

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - Shear force microscopy using piezoresistive cantilevers in surface metrology

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Gotszalk, Teodor, Kopiec, Daniel, Sierakowski, Andrzej, Janus, Paweł, Grabiec, Piotr, Rangelow, Ivo W.

Year:

2014

Language:

english

File:

PDF, 729 KB

english, 2014

25

Food for the Living: a Reassessment of a Bronze Age Barrow at Buckskin, Basingstoke, Hampshire.

Allen, Michael J., Morris, Michael, Clark, R.H., Applin, Barbara, ApSimon, A.M., King, Andrew C., Newbury, M., Russell, M.J.G., Smith, Rachael Seager, Whitbread, I.K.

Journal:

Proceedings of the Prehistoric Society

Year:

1995

Language:

english

File:

PDF, 5.37 MB

english, 1995

26

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Creating nanohole arrays with the helium ion microscope

Ananth, Mohan, Stern, Lewis, Ferranti, David, Huynh, Chuong, Notte, John, Scipioni, Larry, Sanford, Colin, Thompson, Bill, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel

Year:

2011

Language:

english

File:

PDF, 4.28 MB

english, 2011

27

The Lost History of the New Madrid Earthquakes The Lost History of the New Madrid Earthquakes . By Conevery Bolton Valencius (Chicago, University of Chicago Press, 2013) 460 pp. $35.00

Newbury, Michael

Journal:

Journal of Interdisciplinary History

Year:

2014

Language:

english

File:

PDF, 172 KB

english, 2014

28

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - 3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology?

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Villarrubia, J. S., Vladár, A. E., Postek, M. T.

Year:

2014

Language:

english

File:

PDF, 936 KB

english, 2014

29

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 29 September 2015)] Scanning Microscopies 2015 - Photomask linewidth comparison by PTB and NIST

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Bergmann, D., Bodermann, B., Bosse, H., Buhr, E., Dai, G., Dixson, R., Häßler-Grohne, W., Hahm, K., Wurm, M.

Year:

2015

Language:

english

File:

PDF, 482 KB

english, 2015

30

SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 29 September 2015)] Scanning Microscopies 2015 - SEM/EDS analysis for problem solving in the food industry

Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Niemeyer, Wayne D.

Year:

2015

Language:

english

File:

PDF, 762 KB

english, 2015

31

SPIE Proceedings [SPIE SPIE Scanning Microscopy - Monterey, CA (Monday 4 May 2009)] Scanning Microscopy 2009 - Construction of a new type of low-energy scanning electron microscope with atomic resolution

Eastham, D. A., Postek, Michael T., Newbury, Dale E., Edmondson, P., Donnelly, S., Platek, S. Frank, Joy, David C., Olsson, E., Svensson, K., Bleloch, A.

Year:

2009

Language:

english

File:

PDF, 823 KB

english, 2009

32

Synchrotron applications in archaeometallurgy: Analysis of high zinc brass astrolabes

Newbury, Brian, Stephenson, Bruce, Almer, Jon, Notis, Michael, Cargill, G. S., Stephenson, G. Brian, Haeffner, Dean

Journal:

Powder Diffraction

Year:

2004

Language:

english

File:

PDF, 195 KB

english, 2004

33

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Imaging Spectrometry VI - Detection of manmade objects

Newbury, Amy B., Nischan, Melissa L., Joseph, Rose, Iyengar, Mrinal A., Willard, Berton C., Libby, Justin, Swanson, Gary J., Johnson, Bernadette, Burke, Hsiao-hua K., Descour, Michael R., Shen, Sylvia

Year:

2000

Language:

english

File:

PDF, 320 KB

english, 2000

34

Scanning Electron Microscopy and X-Ray Microanalysis || Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 2.71 MB

english, 2018

35

Scanning Electron Microscopy and X-Ray Microanalysis || X-Ray Microanalysis Case Studies

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 2.62 MB

english, 2018

36

Scanning Electron Microscopy and X-Ray Microanalysis || Ion Beam Microscopy

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 1.26 MB

english, 2018

37

Scanning Electron Microscopy and X-Ray Microanalysis || Energy Dispersive X-Ray Microanalysis Checklist

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 237 KB

english, 2018

38

Scanning Electron Microscopy and X-Ray Microanalysis || Scanning Electron Microscope (SEM) Instrumentation

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 3.37 MB

english, 2018

39

Scanning Electron Microscopy and X-Ray Microanalysis || Low Beam Energy X-Ray Microanalysis

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 1.80 MB

english, 2018

40

Scanning Electron Microscopy and X-Ray Microanalysis || Variable Pressure Scanning Electron Microscopy (VPSEM)

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 1.13 MB

english, 2018

41

Scanning Electron Microscopy and X-Ray Microanalysis || Compositional Mapping

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 5.08 MB

english, 2018

42

Scanning Electron Microscopy and X-Ray Microanalysis || Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 2.75 MB

english, 2018

43

Scanning Electron Microscopy and X-Ray Microanalysis || The Visibility of Features in SEM Images

Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.

Year:

2018

Language:

english

File:

PDF, 1.66 MB

english, 2018

44

Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II

Ritchie, Nicholas W. M., Mengason, Michael J., Newbury, Dale E.

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 264 KB

english, 2017

45

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

Newbury, Dale, Ritchie, Nicholas, Mengason, Michael, Scott, Keana

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 448 KB

english, 2017

46

Historical Child Sexual Abuse Investigations: A Case for Law Reform

Newbury, Michael

Journal:

Current Issues in Criminal Justice

Year:

2014

Language:

english

File:

PDF, 522 KB

english, 2014

47

Genetic basis for co-adaptive gene complexes in rice (Oryza sativa L.) landraces

Brian V. Ford-Lloyd, H. John Newbury, Michael T. Jackson, Parminder S. Virk

Journal:

Year:

2001

Language:

english

File:

PDF, 285 KB

english, 2001

48

Genetic heterogeneity in LEOPARD syndrome: two families with no mutations inPTPN11

Kamini Kalidas, Adam C. Shaw, Andrew H. Crosby, Ruth Newbury-Ecob, Lynn Greenhalgh, Isabel K. Temple, Caroline Law, Amisha Patel, Michael A. Patton, Steve Jeffery

Journal:

Journal of Human Genetics

Year:

2005

Language:

english

File:

PDF, 211 KB

english, 2005

49

‘Medicine’s Next Goldmine?’ The Implications of New Genetic Health Technologies for the Health Service

Michael Calnan, David Wainwright, Peter Glasner, Ruth Newbury-Ecob, Ewan Ferlie

Journal:

Medicine, Health Care and Philosophy

Year:

2006

Language:

english

File:

PDF, 193 KB

english, 2006

50

Spirometry and impulse oscillometry (IOS) for detection of respiratory abnormalities in metropolitan firefighters

Tjard SCHERMER, Winifred MALBON, Wendy NEWBURY, Christine HOLTON, Michael SMITH, Michael MORGAN, Alan CROCKETT

Journal:

Year:

2010

Language:

english

File:

PDF, 607 KB

english, 2010